Skip to main content

2024 | OriginalPaper | Buchkapitel

SEE: Spherical Embedding Expansion for Improving Deep Metric Learning

verfasst von : Binh Minh Le, Simon S. Woo

Erschienen in: Advances in Knowledge Discovery and Data Mining

Verlag: Springer Nature Singapore

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

The primary goal of deep metric learning is to construct a comprehensive embedding space that can effectively represent samples originating from both intra- and inter-classes. Although extensive prior work has explored diverse metric functions and innovative training strategies, much of this work relies on default training data. Consequently, the potential variations inherent within this data remain largely unexplored, constraining the model’s robustness to unseen images. In this context, we introduce the Spherical Embedding Expansion (SEE) method. SEE aims to uncover the latent semantic variations in training data. Especially, our method augments the embedding space with synthetic representations based on Max-Mahalanobis distribution (MMD) centers, which maximize the dispersion of these synthetic features without increasing computational costs. We evaluated the efficacy of SEE on four renowned standard benchmarks for the image retrieval task. The results demonstrate that SEE consistently enhances the performance of conventional methods when integrated with them, setting a new benchmark for deep metric learning performance across all settings. Particularly, the proposed method reveals its potency, especially when training with a low-dimensional embedding space and a large number of classes.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literatur
1.
Zurück zum Zitat Aziere, N., Todorovic, S.: Ensemble deep manifold similarity learning using hard proxies. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 7299–7307 (2019) Aziere, N., Todorovic, S.: Ensemble deep manifold similarity learning using hard proxies. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 7299–7307 (2019)
2.
Zurück zum Zitat Bengio, Y., Louradour, J., Collobert, R., Weston, J.: Curriculum learning. In: Proceedings of the 26th Annual International Conference on Machine Learning, pp. 41–48 (2009) Bengio, Y., Louradour, J., Collobert, R., Weston, J.: Curriculum learning. In: Proceedings of the 26th Annual International Conference on Machine Learning, pp. 41–48 (2009)
3.
Zurück zum Zitat Caron, M., et al.: Emerging properties in self-supervised vision transformers. In: Proceedings of the IEEE/CVF International Conference on Computer Vision, pp. 9650–9660 (2021) Caron, M., et al.: Emerging properties in self-supervised vision transformers. In: Proceedings of the IEEE/CVF International Conference on Computer Vision, pp. 9650–9660 (2021)
4.
Zurück zum Zitat Chen, W., Chen, X., Zhang, J., Huang, K.: Beyond triplet loss: a deep quadruplet network for person re-identification. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 403–412 (2017) Chen, W., Chen, X., Zhang, J., Huang, K.: Beyond triplet loss: a deep quadruplet network for person re-identification. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 403–412 (2017)
5.
Zurück zum Zitat Chopra, S., Hadsell, R., LeCun, Y.: Learning a similarity metric discriminatively, with application to face verification. In: 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR 2005), vol. 1, pp. 539–546. IEEE (2005) Chopra, S., Hadsell, R., LeCun, Y.: Learning a similarity metric discriminatively, with application to face verification. In: 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR 2005), vol. 1, pp. 539–546. IEEE (2005)
6.
Zurück zum Zitat Deng, J., Guo, J., Xue, N., Zafeiriou, S.: ArcFace: additive angular margin loss for deep face recognition. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 4690–4699 (2019) Deng, J., Guo, J., Xue, N., Zafeiriou, S.: ArcFace: additive angular margin loss for deep face recognition. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 4690–4699 (2019)
7.
Zurück zum Zitat Dosovitskiy, A., et al.: An image is worth 16\(\times \)16 words: transformers for image recognition at scale. arXiv preprint arXiv:2010.11929 (2020) Dosovitskiy, A., et al.: An image is worth 16\(\times \)16 words: transformers for image recognition at scale. arXiv preprint arXiv:​2010.​11929 (2020)
8.
Zurück zum Zitat Duan, Y., Zheng, W., Lin, X., Lu, J., Zhou, J.: Deep adversarial metric learning. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 2780–2789 (2018) Duan, Y., Zheng, W., Lin, X., Lu, J., Zhou, J.: Deep adversarial metric learning. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 2780–2789 (2018)
9.
Zurück zum Zitat El-Nouby, A., Neverova, N., Laptev, I., Jégou, H.: Training vision transformers for image retrieval. arXiv preprint arXiv:2102.05644 (2021) El-Nouby, A., Neverova, N., Laptev, I., Jégou, H.: Training vision transformers for image retrieval. arXiv preprint arXiv:​2102.​05644 (2021)
10.
Zurück zum Zitat Ermolov, A., Mirvakhabova, L., Khrulkov, V., Sebe, N., Oseledets, I.: Hyperbolic vision transformers: combining improvements in metric learning. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 7409–7419 (2022) Ermolov, A., Mirvakhabova, L., Khrulkov, V., Sebe, N., Oseledets, I.: Hyperbolic vision transformers: combining improvements in metric learning. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 7409–7419 (2022)
12.
Zurück zum Zitat Grill, J.B., et al.: Bootstrap your own latent-a new approach to self-supervised learning. Adv. Neural. Inf. Process. Syst. 33, 21271–21284 (2020) Grill, J.B., et al.: Bootstrap your own latent-a new approach to self-supervised learning. Adv. Neural. Inf. Process. Syst. 33, 21271–21284 (2020)
13.
Zurück zum Zitat Gu, G., Ko, B.: Symmetrical synthesis for deep metric learning. In: Proceedings of the AAAI Conference on Artificial Intelligence, vol. 34, pp. 10853–10860 (2020) Gu, G., Ko, B.: Symmetrical synthesis for deep metric learning. In: Proceedings of the AAAI Conference on Artificial Intelligence, vol. 34, pp. 10853–10860 (2020)
14.
Zurück zum Zitat Harwood, B., Kumar BG, V., Carneiro, G., Reid, I., Drummond, T.: Smart mining for deep metric learning. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 2821–2829 (2017) Harwood, B., Kumar BG, V., Carneiro, G., Reid, I., Drummond, T.: Smart mining for deep metric learning. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 2821–2829 (2017)
15.
Zurück zum Zitat He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 770–778 (2016) He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 770–778 (2016)
16.
Zurück zum Zitat Huang, Y., et al.: CurricularFace: adaptive curriculum learning loss for deep face recognition. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 5901–5910 (2020) Huang, Y., et al.: CurricularFace: adaptive curriculum learning loss for deep face recognition. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 5901–5910 (2020)
17.
Zurück zum Zitat Kim, S., Kim, D., Cho, M., Kwak, S.: Proxy anchor loss for deep metric learning. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 3238–3247 (2020) Kim, S., Kim, D., Cho, M., Kwak, S.: Proxy anchor loss for deep metric learning. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 3238–3247 (2020)
18.
Zurück zum Zitat Kim, S., Seo, M., Laptev, I., Cho, M., Kwak, S.: Deep metric learning beyond binary supervision. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 2288–2297 (2019) Kim, S., Seo, M., Laptev, I., Cho, M., Kwak, S.: Deep metric learning beyond binary supervision. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 2288–2297 (2019)
19.
Zurück zum Zitat Ko, B., Gu, G.: Embedding expansion: augmentation in embedding space for deep metric learning. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 7255–7264 (2020) Ko, B., Gu, G.: Embedding expansion: augmentation in embedding space for deep metric learning. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 7255–7264 (2020)
20.
Zurück zum Zitat Krause, J., Stark, M., Deng, J., Fei-Fei, L.: 3D object representations for fine-grained categorization. In: Proceedings of the IEEE International Conference on Computer Vision Workshops, pp. 554–561 (2013) Krause, J., Stark, M., Deng, J., Fei-Fei, L.: 3D object representations for fine-grained categorization. In: Proceedings of the IEEE International Conference on Computer Vision Workshops, pp. 554–561 (2013)
21.
Zurück zum Zitat Liu, Z., Luo, P., Qiu, S., Wang, X., Tang, X.: DeepFashion: powering robust clothes recognition and retrieval with rich annotations. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 1096–1104 (2016) Liu, Z., Luo, P., Qiu, S., Wang, X., Tang, X.: DeepFashion: powering robust clothes recognition and retrieval with rich annotations. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 1096–1104 (2016)
23.
Zurück zum Zitat Nielsen, F., Sun, K.: Guaranteed bounds on the Kullback-Leibler divergence of univariate mixtures. IEEE Signal Process. Lett. 23(11), 1543–1546 (2016)CrossRef Nielsen, F., Sun, K.: Guaranteed bounds on the Kullback-Leibler divergence of univariate mixtures. IEEE Signal Process. Lett. 23(11), 1543–1546 (2016)CrossRef
24.
Zurück zum Zitat Oh Song, H., Xiang, Y., Jegelka, S., Savarese, S.: Deep metric learning via lifted structured feature embedding. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 4004–4012 (2016) Oh Song, H., Xiang, Y., Jegelka, S., Savarese, S.: Deep metric learning via lifted structured feature embedding. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 4004–4012 (2016)
25.
Zurück zum Zitat Pang, T., Du, C., Zhu, J.: Max-mahalanobis linear discriminant analysis networks. In: International Conference on Machine Learning, pp. 4016–4025. PMLR (2018) Pang, T., Du, C., Zhu, J.: Max-mahalanobis linear discriminant analysis networks. In: International Conference on Machine Learning, pp. 4016–4025. PMLR (2018)
26.
Zurück zum Zitat Qian, Q., Shang, L., Sun, B., Hu, J., Li, H., Jin, R.: SoftTriple Loss: deep metric learning without triplet sampling. In: Proceedings of the IEEE/CVF International Conference on Computer Vision, pp. 6450–6458 (2019) Qian, Q., Shang, L., Sun, B., Hu, J., Li, H., Jin, R.: SoftTriple Loss: deep metric learning without triplet sampling. In: Proceedings of the IEEE/CVF International Conference on Computer Vision, pp. 6450–6458 (2019)
27.
Zurück zum Zitat Qiao, L., Shi, Y., Li, J., Wang, Y., Huang, T., Tian, Y.: Transductive episodic-wise adaptive metric for few-shot learning. In: Proceedings of the IEEE/CVF International Conference on Computer Vision, pp. 3603–3612 (2019) Qiao, L., Shi, Y., Li, J., Wang, Y., Huang, T., Tian, Y.: Transductive episodic-wise adaptive metric for few-shot learning. In: Proceedings of the IEEE/CVF International Conference on Computer Vision, pp. 3603–3612 (2019)
28.
Zurück zum Zitat Roth, K., Brattoli, B., Ommer, B.: MIC: mining interclass characteristics for improved metric learning. In: Proceedings of the IEEE/CVF International Conference on Computer Vision, pp. 8000–8009 (2019) Roth, K., Brattoli, B., Ommer, B.: MIC: mining interclass characteristics for improved metric learning. In: Proceedings of the IEEE/CVF International Conference on Computer Vision, pp. 8000–8009 (2019)
30.
Zurück zum Zitat Touvron, H., Cord, M., Douze, M., Massa, F., Sablayrolles, A., Jégou, H.: Training data-efficient image transformers & distillation through attention. In: International Conference on Machine Learning, pp. 10347–10357. PMLR (2021) Touvron, H., Cord, M., Douze, M., Massa, F., Sablayrolles, A., Jégou, H.: Training data-efficient image transformers & distillation through attention. In: International Conference on Machine Learning, pp. 10347–10357. PMLR (2021)
31.
Zurück zum Zitat Verma, V., Lamb, A., Beckham, C., Najafi, A., Mitliagkas, I., Lopez-Paz, D., Bengio, Y.: Manifold mixup: Better representations by interpolating hidden states. In: International Conference on Machine Learning, pp. 6438–6447. PMLR (2019) Verma, V., Lamb, A., Beckham, C., Najafi, A., Mitliagkas, I., Lopez-Paz, D., Bengio, Y.: Manifold mixup: Better representations by interpolating hidden states. In: International Conference on Machine Learning, pp. 6438–6447. PMLR (2019)
32.
Zurück zum Zitat Wah, C., Branson, S., Welinder, P., Perona, P., Belongie, S.: The caltech-UCSD birds-200-2011 dataset (2011) Wah, C., Branson, S., Welinder, P., Perona, P., Belongie, S.: The caltech-UCSD birds-200-2011 dataset (2011)
33.
Zurück zum Zitat Wang, F., Xiang, X., Cheng, J., Yuille, A.L.: NormFace: L2 hypersphere embedding for face verification. In: Proceedings of the 25th ACM International Conference on Multimedia, pp. 1041–1049 (2017) Wang, F., Xiang, X., Cheng, J., Yuille, A.L.: NormFace: L2 hypersphere embedding for face verification. In: Proceedings of the 25th ACM International Conference on Multimedia, pp. 1041–1049 (2017)
34.
Zurück zum Zitat Wang, H., et al.: CosFace: large margin cosine loss for deep face recognition. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 5265–5274 (2018) Wang, H., et al.: CosFace: large margin cosine loss for deep face recognition. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 5265–5274 (2018)
35.
Zurück zum Zitat Wang, J., et al.: Learning fine-grained image similarity with deep ranking. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 1386–1393 (2014) Wang, J., et al.: Learning fine-grained image similarity with deep ranking. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 1386–1393 (2014)
36.
Zurück zum Zitat Wang, X., Han, X., Huang, W., Dong, D., Scott, M.R.: Multi-similarity loss with general pair weighting for deep metric learning. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 5022–5030 (2019) Wang, X., Han, X., Huang, W., Dong, D., Scott, M.R.: Multi-similarity loss with general pair weighting for deep metric learning. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 5022–5030 (2019)
37.
Zurück zum Zitat Wang, X., Zhang, H., Huang, W., Scott, M.R.: Cross-batch memory for embedding learning. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 6388–6397 (2020) Wang, X., Zhang, H., Huang, W., Scott, M.R.: Cross-batch memory for embedding learning. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 6388–6397 (2020)
38.
Zurück zum Zitat Wu, C.Y., Manmatha, R., Smola, A.J., Krahenbuhl, P.: Sampling matters in deep embedding learning. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 2840–2848 (2017) Wu, C.Y., Manmatha, R., Smola, A.J., Krahenbuhl, P.: Sampling matters in deep embedding learning. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 2840–2848 (2017)
39.
40.
Zurück zum Zitat Zhang, H., Cisse, M., Dauphin, Y.N., Lopez-Paz, D.: mixup: beyond empirical risk minimization. arXiv preprint arXiv:1710.09412 (2017) Zhang, H., Cisse, M., Dauphin, Y.N., Lopez-Paz, D.: mixup: beyond empirical risk minimization. arXiv preprint arXiv:​1710.​09412 (2017)
41.
42.
Zurück zum Zitat Zheng, W., Chen, Z., Lu, J., Zhou, J.: Hardness-aware deep metric learning. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 72–81 (2019) Zheng, W., Chen, Z., Lu, J., Zhou, J.: Hardness-aware deep metric learning. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 72–81 (2019)
Metadaten
Titel
SEE: Spherical Embedding Expansion for Improving Deep Metric Learning
verfasst von
Binh Minh Le
Simon S. Woo
Copyright-Jahr
2024
Verlag
Springer Nature Singapore
DOI
https://doi.org/10.1007/978-981-97-2253-2_11

Premium Partner