Skip to main content

2024 | OriginalPaper | Buchkapitel

SoK: Parameterization of Fault Adversary Models Connecting Theory and Practice

verfasst von : Dilara Toprakhisar, Svetla Nikova, Ventzislav Nikov

Erschienen in: Topics in Cryptology – CT-RSA 2024

Verlag: Springer Nature Switzerland

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

Since the first fault attack by Boneh et al. in 1997, various physical fault injection mechanisms have been explored to induce errors in electronic systems. Subsequent fault analysis methods of these errors have been studied, and successfully used to attack many cryptographic implementations. This poses a significant challenge to the secure implementation of cryptographic algorithms. To address this, numerous countermeasures have been proposed. Nevertheless, these countermeasures are primarily designed to protect against the particular assumptions made by the fault analysis methods. These assumptions, however, encompass only a limited range of the capabilities inherent to physical fault injection mechanisms.
In this paper, we narrow our focus to fault attacks and countermeasures specific to ASICs, and introduce a novel parameterized fault adversary model capturing an adversary’s control over an ASIC. We systematically map (a) the physical fault injection mechanisms, (b) adversary models assumed in fault analysis, and (c) adversary models used to design countermeasures into our introduced model. This model forms the basis for our comprehensive exploration that covers a broad spectrum of fault attacks and countermeasures within symmetric key cryptography as a comprehensive survey. Furthermore, our investigation highlights a notable misalignment among the adversary models assumed in countermeasures, fault attacks, and the intrinsic capabilities of the physical fault injection mechanisms. Through this study, we emphasize the need to reevaluate existing fault adversary models, and advocate for the development of a unified model.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literatur
2.
Zurück zum Zitat Agoyan, M., Dutertre, J., Naccache, D., Robisson, B., Tria, A.: When clocks fail: on critical paths and clock faults. In: Gollmann, D., Lanet, J., Iguchi-Cartigny, J. (eds.) CARDIS 2010. LNCS, vol. 6035, pp. 182–193. Springer, Heidelberg (2010). https://doi.org/10.1007/978-3-642-12510-2_13 Agoyan, M., Dutertre, J., Naccache, D., Robisson, B., Tria, A.: When clocks fail: on critical paths and clock faults. In: Gollmann, D., Lanet, J., Iguchi-Cartigny, J. (eds.) CARDIS 2010. LNCS, vol. 6035, pp. 182–193. Springer, Heidelberg (2010). https://​doi.​org/​10.​1007/​978-3-642-12510-2_​13
3.
Zurück zum Zitat Amiel, F., Villegas, K., Feix, B., Marcel, L.: Passive and active combined attacks: Combining fault attacks and side channel analysis. In: Breveglieri, L., Gueron, S., Koren, I., Naccache, D., Seifert, J. (eds.) Fourth International Workshop on Fault Diagnosis and Tolerance in Cryptography, 2007, FDTC 2007, Vienna, Austria, 10 September 2007, pp. 92–102. IEEE Computer Society (2007). https://doi.org/10.1109/FDTC.2007.4318989 Amiel, F., Villegas, K., Feix, B., Marcel, L.: Passive and active combined attacks: Combining fault attacks and side channel analysis. In: Breveglieri, L., Gueron, S., Koren, I., Naccache, D., Seifert, J. (eds.) Fourth International Workshop on Fault Diagnosis and Tolerance in Cryptography, 2007, FDTC 2007, Vienna, Austria, 10 September 2007, pp. 92–102. IEEE Computer Society (2007). https://​doi.​org/​10.​1109/​FDTC.​2007.​4318989
4.
Zurück zum Zitat Aumüller, C., Bier, P., Fischer, W., Hofreiter, P., Seifert, J.: Fault attacks on RSA with CRT: concrete results and practical countermeasures. In: Jr., B.S.K., Koç, Ç.K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 260–275. Springer, Heidelberg (2002). https://doi.org/10.1007/3-540-36400-5_20 Aumüller, C., Bier, P., Fischer, W., Hofreiter, P., Seifert, J.: Fault attacks on RSA with CRT: concrete results and practical countermeasures. In: Jr., B.S.K., Koç, Ç.K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 260–275. Springer, Heidelberg (2002). https://​doi.​org/​10.​1007/​3-540-36400-5_​20
7.
Zurück zum Zitat Biham, E., Granboulan, L., Nguyen, P.Q.: Impossible fault analysis of RC4 and differential fault analysis of RC4. In: Gilbert, H., Handschuh, H. (eds.) FSE 2005. LNCS, vol. 3557, pp. 359–367. Springer, Heidelberg (2005). https://doi.org/10.1007/11502760_24 Biham, E., Granboulan, L., Nguyen, P.Q.: Impossible fault analysis of RC4 and differential fault analysis of RC4. In: Gilbert, H., Handschuh, H. (eds.) FSE 2005. LNCS, vol. 3557, pp. 359–367. Springer, Heidelberg (2005). https://​doi.​org/​10.​1007/​11502760_​24
10.
15.
Zurück zum Zitat Clavier, C., Feix, B., Gagnerot, G., Roussellet, M.: Passive and active combined attacks on AES combining fault attacks and side channel analysis. In: 2010 Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 10–19 (2010). https://doi.org/10.1109/FDTC.2010.17 Clavier, C., Feix, B., Gagnerot, G., Roussellet, M.: Passive and active combined attacks on AES combining fault attacks and side channel analysis. In: 2010 Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 10–19 (2010). https://​doi.​org/​10.​1109/​FDTC.​2010.​17
17.
Zurück zum Zitat Courtois, N.T., Ware, D., Jackson, K.M.: Fault-algebraic attacks on inner rounds of des. In: The eSmart 2010 European Smart Card Security Conference (2010) Courtois, N.T., Ware, D., Jackson, K.M.: Fault-algebraic attacks on inner rounds of des. In: The eSmart 2010 European Smart Card Security Conference (2010)
19.
Zurück zum Zitat Dobraunig, C., Eichlseder, M., Groß, H., Mangard, S., Mendel, F., Primas, R.: Statistical ineffective fault attacks on masked AES with fault countermeasures. In: Peyrin, T., Galbraith, S.D. (eds.) ASIACRYPT 2018, Part II. LNCS, vol. 11273, pp. 315–342. Springer, Heidelberg (2018). https://doi.org/10.1007/978-3-030-03329-3_11 Dobraunig, C., Eichlseder, M., Groß, H., Mangard, S., Mendel, F., Primas, R.: Statistical ineffective fault attacks on masked AES with fault countermeasures. In: Peyrin, T., Galbraith, S.D. (eds.) ASIACRYPT 2018, Part II. LNCS, vol. 11273, pp. 315–342. Springer, Heidelberg (2018). https://​doi.​org/​10.​1007/​978-3-030-03329-3_​11
20.
Zurück zum Zitat Dobraunig, C., Eichlseder, M., Korak, T., Lomné, V., Mendel, F.: Statistical fault attacks on nonce-based authenticated encryption schemes. In: Cheon, J.H., Takagi, T. (eds.) ASIACRYPT 2016, Part I. LNCS, vol. 10031, pp. 369–395. Springer, Heidelberg (2016). https://doi.org/10.1007/978-3-662-53887-6_14 Dobraunig, C., Eichlseder, M., Korak, T., Lomné, V., Mendel, F.: Statistical fault attacks on nonce-based authenticated encryption schemes. In: Cheon, J.H., Takagi, T. (eds.) ASIACRYPT 2016, Part I. LNCS, vol. 10031, pp. 369–395. Springer, Heidelberg (2016). https://​doi.​org/​10.​1007/​978-3-662-53887-6_​14
22.
24.
Zurück zum Zitat Feldtkeller, J., Richter-Brockmann, J., Sasdrich, P., Güneysu, T.: CINI MINIS: domain isolation for fault and combined security. In: Yin, H., Stavrou, A., Cremers, C., Shi, E. (eds.) Proceedings of the 2022 ACM SIGSAC Conference on Computer and Communications Security, CCS 2022, Los Angeles, CA, USA, 7–11 November 2022, pp. 1023–1036. ACM (2022). https://doi.org/10.1145/3548606.3560614 Feldtkeller, J., Richter-Brockmann, J., Sasdrich, P., Güneysu, T.: CINI MINIS: domain isolation for fault and combined security. In: Yin, H., Stavrou, A., Cremers, C., Shi, E. (eds.) Proceedings of the 2022 ACM SIGSAC Conference on Computer and Communications Security, CCS 2022, Los Angeles, CA, USA, 7–11 November 2022, pp. 1023–1036. ACM (2022). https://​doi.​org/​10.​1145/​3548606.​3560614
25.
Zurück zum Zitat Fuhr, T., Jaulmes, É., Lomné, V., Thillard, A.: Fault attacks on AES with faulty ciphertexts only. In: Fischer, W., Schmidt, J. (eds.) 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, Los Alamitos, CA, USA, 20 August 2013, pp. 108–118. IEEE Computer Society (2013). https://doi.org/10.1109/FDTC.2013.18 Fuhr, T., Jaulmes, É., Lomné, V., Thillard, A.: Fault attacks on AES with faulty ciphertexts only. In: Fischer, W., Schmidt, J. (eds.) 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, Los Alamitos, CA, USA, 20 August 2013, pp. 108–118. IEEE Computer Society (2013). https://​doi.​org/​10.​1109/​FDTC.​2013.​18
26.
Zurück zum Zitat Ghalaty, N.F., Yuce, B., Taha, M.M.I., Schaumont, P.: Differential fault intensity analysis. In: Tria, A., Choi, D. (eds.) 2014 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2014, Busan, South Korea, 23 September 2014, pp. 49–58. IEEE Computer Society (2014). https://doi.org/10.1109/FDTC.2014.15 Ghalaty, N.F., Yuce, B., Taha, M.M.I., Schaumont, P.: Differential fault intensity analysis. In: Tria, A., Choi, D. (eds.) 2014 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2014, Busan, South Korea, 23 September 2014, pp. 49–58. IEEE Computer Society (2014). https://​doi.​org/​10.​1109/​FDTC.​2014.​15
35.
Zurück zum Zitat Moradi, A., Mischke, O., Paar, C., Li, Y., Ohta, K., Sakiyama, K.: On the power of fault sensitivity analysis and collision side-channel attacks in a combined setting. In: Preneel, B., Takagi, T. (eds.) CHES 2011. LNCS, vol. 6917, pp. 292–311. Springer, Heidelberg (2011). https://doi.org/10.1007/978-3-642-23951-9_20 Moradi, A., Mischke, O., Paar, C., Li, Y., Ohta, K., Sakiyama, K.: On the power of fault sensitivity analysis and collision side-channel attacks in a combined setting. In: Preneel, B., Takagi, T. (eds.) CHES 2011. LNCS, vol. 6917, pp. 292–311. Springer, Heidelberg (2011). https://​doi.​org/​10.​1007/​978-3-642-23951-9_​20
37.
Zurück zum Zitat Ordas, S., Guillaume-Sage, L., Maurine, P.: EM injection: Fault model and locality. In: Homma, N., Lomné, V. (eds.) 2015 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2015, Saint Malo, France, 13 September 2015, pp. 3–13. IEEE Computer Society (2015). https://doi.org/10.1109/FDTC.2015.9 Ordas, S., Guillaume-Sage, L., Maurine, P.: EM injection: Fault model and locality. In: Homma, N., Lomné, V. (eds.) 2015 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2015, Saint Malo, France, 13 September 2015, pp. 3–13. IEEE Computer Society (2015). https://​doi.​org/​10.​1109/​FDTC.​2015.​9
39.
Zurück zum Zitat Quisquater, J.J., Samyde, D.: Eddy current for magnetic analysis with active sensor. In: Proceedings of ESmart 2002 (2002) Quisquater, J.J., Samyde, D.: Eddy current for magnetic analysis with active sensor. In: Proceedings of ESmart 2002 (2002)
41.
Zurück zum Zitat Ramezanpour, K., Ampadu, P., Diehl, W.: Rs-mask: random space masking as an integrated countermeasure against power and fault analysis. In: 2020 IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2020, San Jose, CA, USA, 7–11 December 2020, pp. 176–187. IEEE (2020). https://doi.org/10.1109/HOST45689.2020.9300266 Ramezanpour, K., Ampadu, P., Diehl, W.: Rs-mask: random space masking as an integrated countermeasure against power and fault analysis. In: 2020 IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2020, San Jose, CA, USA, 7–11 December 2020, pp. 176–187. IEEE (2020). https://​doi.​org/​10.​1109/​HOST45689.​2020.​9300266
43.
Zurück zum Zitat Reparaz, O., Meyer, L.D., Bilgin, B., Arribas, V., Nikova, S., Nikov, V., Smart, N.P.: CAPA: the spirit of beaver against physical attacks. In: Shacham, H., Boldyreva, A. (eds.) CRYPTO 2018, Part I. LNCS, vol. 10991, pp. 121–151. Springer, Heidelberg (2018). https://doi.org/10.1007/978-3-319-96884-1_5 Reparaz, O., Meyer, L.D., Bilgin, B., Arribas, V., Nikova, S., Nikov, V., Smart, N.P.: CAPA: the spirit of beaver against physical attacks. In: Shacham, H., Boldyreva, A. (eds.) CRYPTO 2018, Part I. LNCS, vol. 10991, pp. 121–151. Springer, Heidelberg (2018). https://​doi.​org/​10.​1007/​978-3-319-96884-1_​5
44.
Zurück zum Zitat Richter-Brockmann, J., Güneysu, T.: Improved side-channel resistance by dynamic fault-injection countermeasures. In: 31st IEEE International Conference on Application-specific Systems, Architectures and Processors , ASAP 2020, Manchester, United Kingdom, 6–8 July 2020, pp. 117–124. IEEE (2020). https://doi.org/10.1109/ASAP49362.2020.00029 Richter-Brockmann, J., Güneysu, T.: Improved side-channel resistance by dynamic fault-injection countermeasures. In: 31st IEEE International Conference on Application-specific Systems, Architectures and Processors , ASAP 2020, Manchester, United Kingdom, 6–8 July 2020, pp. 117–124. IEEE (2020). https://​doi.​org/​10.​1109/​ASAP49362.​2020.​00029
47.
Zurück zum Zitat Saha, S., Bag, A., Jap, D., Mukhopadhyay, D., Bhasin, S.: Divided we stand, united we fall: Security analysis of some SCA+SIFA countermeasures against sca-enhanced fault template attacks. In: Tibouchi, M., Wang, H. (eds.) ASIACRYPT 2021, Part II. LNCS, vol. 13091, pp. 62–94. Springer, Heidelberg (2021). https://doi.org/10.1007/978-3-030-92075-3_3 Saha, S., Bag, A., Jap, D., Mukhopadhyay, D., Bhasin, S.: Divided we stand, united we fall: Security analysis of some SCA+SIFA countermeasures against sca-enhanced fault template attacks. In: Tibouchi, M., Wang, H. (eds.) ASIACRYPT 2021, Part II. LNCS, vol. 13091, pp. 62–94. Springer, Heidelberg (2021). https://​doi.​org/​10.​1007/​978-3-030-92075-3_​3
48.
Zurück zum Zitat Saha, S., Bag, A., Roy, D.B., Patranabis, S., Mukhopadhyay, D.: Fault template attacks on block ciphers exploiting fault propagation. In: Canteaut, A., Ishai, Y. (eds.) EUROCRYPT 2020, Part I. LNCS, vol. 12105, pp. 612–643. Springer, Heidelberg (2020). https://doi.org/10.1007/978-3-030-45721-1_22 Saha, S., Bag, A., Roy, D.B., Patranabis, S., Mukhopadhyay, D.: Fault template attacks on block ciphers exploiting fault propagation. In: Canteaut, A., Ishai, Y. (eds.) EUROCRYPT 2020, Part I. LNCS, vol. 12105, pp. 612–643. Springer, Heidelberg (2020). https://​doi.​org/​10.​1007/​978-3-030-45721-1_​22
49.
Zurück zum Zitat Saha, S., Jap, D., Roy, D.B., Chakraborti, A., Bhasin, S., Mukhopadhyay, D.: Transform-and-encode: A countermeasure framework for statistical ineffective fault attacks on block ciphers. IACR Cryptol. ePrint Arch., p. 545 (2019). https://eprint.iacr.org/2019/545 Saha, S., Jap, D., Roy, D.B., Chakraborti, A., Bhasin, S., Mukhopadhyay, D.: Transform-and-encode: A countermeasure framework for statistical ineffective fault attacks on block ciphers. IACR Cryptol. ePrint Arch., p. 545 (2019). https://​eprint.​iacr.​org/​2019/​545
50.
Zurück zum Zitat Schellenberg, F., Finkeldey, M., Gerhardt, N., Hofmann, M., Moradi, A., Paar, C.: Large laser spots and fault sensitivity analysis. In: Robinson, W.H., Bhunia, S., Kastner, R. (eds.) 2016 IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2016, McLean, VA, USA, 3–5 May 2016, pp. 203–208. IEEE Computer Society (2016). https://doi.org/10.1109/HST.2016.7495583 Schellenberg, F., Finkeldey, M., Gerhardt, N., Hofmann, M., Moradi, A., Paar, C.: Large laser spots and fault sensitivity analysis. In: Robinson, W.H., Bhunia, S., Kastner, R. (eds.) 2016 IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2016, McLean, VA, USA, 3–5 May 2016, pp. 203–208. IEEE Computer Society (2016). https://​doi.​org/​10.​1109/​HST.​2016.​7495583
51.
Zurück zum Zitat Schneider, T., Moradi, A., Güneysu, T.: Parti - towards combined hardware countermeasures against side-channel and fault-injection attacks. In: Robshaw, M., Katz, J. (eds.) CRYPTO 2016, Part II. LNCS, vol. 9815, pp. 302–332. Springer, Heidelberg (2016). https://doi.org/10.1007/978-3-662-53008-5_11 Schneider, T., Moradi, A., Güneysu, T.: Parti - towards combined hardware countermeasures against side-channel and fault-injection attacks. In: Robshaw, M., Katz, J. (eds.) CRYPTO 2016, Part II. LNCS, vol. 9815, pp. 302–332. Springer, Heidelberg (2016). https://​doi.​org/​10.​1007/​978-3-662-53008-5_​11
58.
Zurück zum Zitat Zussa, L., Dutertre, J., Clédière, J., Tria, A.: Power supply glitch induced faults on FPGA: an in-depth analysis of the injection mechanism. In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, 8–10 July 2013, pp. 110–115. IEEE (2013). https://doi.org/10.1109/IOLTS.2013.6604060 Zussa, L., Dutertre, J., Clédière, J., Tria, A.: Power supply glitch induced faults on FPGA: an in-depth analysis of the injection mechanism. In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, 8–10 July 2013, pp. 110–115. IEEE (2013). https://​doi.​org/​10.​1109/​IOLTS.​2013.​6604060
Metadaten
Titel
SoK: Parameterization of Fault Adversary Models Connecting Theory and Practice
verfasst von
Dilara Toprakhisar
Svetla Nikova
Ventzislav Nikov
Copyright-Jahr
2024
DOI
https://doi.org/10.1007/978-3-031-58868-6_17

Premium Partner