Ausgabe 1/2023
Inhalt (12 Artikel)
Network-on-Chip and Photonic Network-on-Chip Basic Concepts: A Survey
Bahareh Asadi, Syed Maqsood Zia, Hamza Mohammed Ridha Al-Khafaji, Asghar Mohamadian
Open Access
Identifying Resistive Open Defects in Embedded Cells under Variations
Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich
Refined Self-calibration of an Inductorless Low-noise Amplifier with Non-intrusive Circuit
Wenrun Xiao, Jidong Diao, Yanping Qiao, Xianming Liu, Shan He, Donghui Guo
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing
Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
DFS-KeyLevel: A Two-Layer Test Scenario Generation Approach for UML Activity Diagram
Xiaozhi Du, Jinjin Zhang, Kai Chen, Yanrong Zhou
Fault Detection and Diagnosis of DMFB Using Concurrent Electrodes Actuation
Sourav Ghosh, Surajit Kumar Roy, Chandan Giri
Open Access
An Investigation into the Failure Characteristics of External PCB Traces with Different Angle Bends
Jake Elliot, Jason Brown
Intrinsic Based Self-healing Adder Design Using Chromosome Reconstruction Algorithm
Raghavendra Kumar Sakali, Noor Mahammad Shak