Ausgabe 6/2022
Inhalt (9 Artikel)
Effect of Sizing and Scaling on Power Dissipation and Resilience of an RHBD SRAM Circuit
Neha Pannu, Neelam Rup Prakash, Jasbir Kaur
Development of a Simplified Programming Kit Based 16LF18856 for Embedded Systems Testing and Education in Developing Countries
Jean de Dieu Nguimfack-Ndongmo, Kevin Kentsa Zana, Derek Ajesam Asoh, Nicole Adélaïde Kengnou Telem, René Kuate-Fochie, Godpromesse Kenné
Open Access
A Complete Design-for-Test Scheme for Reconfigurable Scan Networks
Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich
Smell Detection Agent Optimization Approach to Path Generation in Automated Software Testing
S. S. Vinod Chandra, S. Saju Sankar, H. S. Anand
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Design and Evaluation of XOR Arbiter Physical Unclonable Function and its Implementation on FPGA in Hardware Security Applications
R. Naveenkumar, N. M. Sivamangai, A. Napolean, S. Sridevi Sathya Priya
A CatBoost Based Approach to Detect Label Flipping Poisoning Attack in Hardware Trojan Detection Systems
Richa Sharma, G. K. Sharma, Manisha Pattanaik